Modeling of an elastic field scattered by an interface defect

Fìz.-mat. model. ìnf. tehnol. 2021, 33:45-51

Abstract

The problem of the shear-wave (SH-wave) diffraction from the semi-infinite interface defect in the rigid junction of the elastic layer and the half-space is solved. The defect is modeled by the impedance surface. The dependences of the scattered displacement field, reflection and transmission coefficients on the structure parameters are presented in analytical form. The examples of numerical modeling of field characteristics are provided.

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